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Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (SpringerBriefs in Materials) Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (SpringerBriefs in Materials) by Juan Pablo Borja,Toh-Ming Lu,Joel Plawsky

Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (SpringerBriefs in Materials)

by Juan Pablo Borja,Toh-Ming Lu,Joel Plawsky


ISBN 13: 9783319432182

Format: Paperback (116 pages)
Publisher: Springer
Published: 26 Sep 2016

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